R&D Scientist

Position Summary

We are seeking a highly motivated R&D Scientist to join our advanced metrology and analytics research team in Singapore. The successful candidate will play an active hands-on role in developing next-generation data analytics and modeling solutions for Critical Dimension Small Angle X-ray Scattering (CD-SAXS) and Optical Critical Dimension (OCD) metrologies.

This role focuses on developing innovative algorithms, physics-based modeling, machine learning approaches, and data fusion methodologies that enable accurate and robust characterization of advanced semiconductor structures. The scientist will collaborate closely with R&D scientists, applications, software engineering, and product / program management to create differentiated metrology solutions for next-generation semiconductor manufacturing.

Roles and Responsibilities:

• Interface with application scientists, product/program management, and marketing team to understand and analyze customers’ requirements and technology gaps.
• Innovate and develop new concepts to address customer challenges and close identified technology gaps, working both independently and within cross‑functional teams.
• Collect and analyze technical data, conduct literature reviews, propose new methodologies or improvements to existing solutions.
• Conceptualize, design, prototype, and fine-tune algorithms and find the best approach to solve a specific problem.
• Develop advanced algorithms for CD-SAXS data analysis, profile reconstruction, and parameter extraction.
• Explore machine learning and AI techniques to enhance model fitting, inversion, and uncertainty quantification.
• Improve measurement accuracy, precision, robustness, and computational efficiency of OCD and CD-SAXS solutions.
• Create data fusion frameworks that leverage complementary information from multiple metrology sources.
• Develop and execute test plans to verify algorithm performance, reliability, and readiness for deployment in production environments.
• Collaborate with product and software engineering teams to transition research concepts into production-ready solutions.
• Publish technical papers, invention disclosures, and patents related to metrology analytics and modeling.

Play a key role in innovative technology development, deliver solutions that create measurable value for customers and business.

Qualifications

Required Qualifications

• Ph.D. or Master’s degree in Chemical Physics, Physics, Applied Physics, Electrical Engineering, Materials Science, Optics, Mathematics, Statistics, Data Science, or a related field.
• Strong background in modeling, data analysis, and scientific computing.
• Experience developing algorithms using Python, MATLAB, C++, or similar programming languages.
• Solid understanding of signal processing, statistical analysis, optimization methods, and inverse problem solving.
• Strong communication skills and ability to work in a multidisciplinary, fast-paced, iterative development environment.
• Demonstrate intellectual honesty and a sense of urgency in driving projects to completion.
• Ability to travel up to 20%.

Preferred Qualifications

• Experience in semiconductor metrology, process control, or computational lithography.
• Knowledge of X-ray scattering techniques including CD-SAXS, XRD, XRR etc., optical metrology technologies including OCD, scatterometry, ellipsometry, or related methods.
• Familiarity with machine learning, Bayesian inference, uncertainty quantification, and data fusion techniques.
• Experience developing physics-informed AI or hybrid modeling approaches.
• Track record of publications, patents, or significant technical contributions in relevant fields.

Success Factors

The ideal candidate will:

• Be passionate about solving challenging semiconductor metrology problems.
• Demonstrate strong analytical and scientific problem-solving skills.
• Thrive in a highly collaborative research environment.
• Balance scientific rigor with practical product impact.
• Drive innovation from early-stage concepts through technology deployment.