Sergio Martinez Herrera

– Manager of the areas of Research, Quality, test and Client Support. – Responsible for software product development and task prioritization using Agile Scrum. – Definition and implementation of artificial intelligence research strategy and scientific publications.

– Development of metrology and defectivity algorithms in images acquired from electron microscopes (AFM, SEM, TEM, XSEM) for semiconductor and chemical characterization applications. – The algorithms were based in image processing and machine learning covering from image enhancement to edge, object detection and measurement. – Utilized machine learning technology to accelerate the development of plasma etching processes. – Introduced digital twin technology to increase yield of processes. – Designed tools for analysis of lithography patterns and nanostructures. – Performed metrology and segmentation in SEM/TEM imaging, accelerating semiconductor analysis through advanced deep learning techniques.